| URN |
etd-0729112-181430 |
Statistics |
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|
| Author |
Xian-Jin Huang |
| Author's Email Address |
yydde2005@hotmail.com |
| Department |
Institute Of Mechanical Engineering |
| Year |
2011 |
Semester |
2 |
| Degree |
Master |
Type of Document |
Master's Thesis |
| Language |
zh-TW.Big5 Chinese |
Page Count |
68 |
| Title |
A study of the solar wafers counting with automated optical inspection technology |
| Keyword |
Mechatronics
Automated optical inspection
Solar wafers
Solar wafers
Automated optical inspection
Mechatronics
|
| Abstract |
Solar wafers has been widely used in the power generation system gradually, it makes solar wafer demands increased. If the manual counting the numbers of solar wafers, the efficiency of production will be decreased and easily makes chip broken. In this paper, we design an automatic solar wafers counting equipment with automated optical inspection and mechatronic technology. First, the stack of solar wafers is placed on the equipment platform, stepping motor drives the CCD to capture the side images. Afterward, it will integrate the several partial images of the solar wafer stack into one image and then count how many solar wafers in this image with digital image processing. The programming of the entire system is written by Labview 8.5 graphical language. The automatic solar wafers counting equipment in this article is experimental verification, the counting time of seventy wafers is about 4 seconds and the result is correct. |
| Advisor Committee |
Cheng-Kuang Huang - advisor
Kun- Ling Wu - co-chair
Chih-Jen Wu - chair
|
| Files |
indicate in-campus access at 3 years and off-campus access at 3 years |
| Date of Defense |
2012-07-13 |
Date of Submission |
2012-07-29 |
